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FSM 125 raft

Rapid Area Fast Topography Nano Measurement

FSM 125 RAFT

TOPOGRAPHY FAST PROFILE OUTPUT

ROUGHNESS FROM MICRON TO NANO SCALE

Surface Topography Measurement
Surface Roughness Measurement

Area- based Profile Measurement

  • Contactless probe of full 2D height and cross-section line profiles
  • Phase and Intensity Modes Allow Nano meter Height Resolution
  • Measurement Area Selectable Via Lens from 250 μm to 8mm
  • Spatial Resolution Less 1 μm
  • Profile-based CD measurement

Area- based Roughness Measurement

  • The Roughness of Surfaces in their entirety without Tactile Scanning
  • A Profile Series for 2D Parameters, also Full – Surface 3D Roughness Parameters
  • Transfer of the Tactile R – Parameters of Profile Devices to the Modern S – Parameters