F50s are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide. Thickness measured in less than a second.
The TMS-2000 can measure the flatness of the wafer with up to 1 nm repeatability. Unique data acquisition software for consistent measurement & high environmental stability.
The M-2000® ELLIPSOMETER line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design.
