The Surfscan® SP7XP unpatterned wafer inspection system facilitates qualification and monitoring of processes and tools for IC, wafer and materials manufacturers.
The Candela® 8720 advanced surface inspection system captures a variety of mission-critical substrate and epitaxial defects for the LED, photonics, communications.
W SERIES MICRO XRF uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest for coating thickness analysis using XRF instruments.
HMI eScan 1100 The multiple e-beam wafer inspection system for in-line defect inspection applications. Following in the footsteps of the eScan 1000, It offers high throughput ..
