F20 Series Film Thickness Measurement Instruments
F20s are general-purpose film thickness measurement instruments, and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all of our thickness measurement instruments, the F20 connects to the USB port of your Windows® computer and sets up in minutes.
The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range. The standard F20 is our most popular product.
The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range. The standard F20 is our most popular product.
F50 Film Thickness Measurement Mapping Instrument
Automated Film Thickness Mapping.The F50 family of products can map film thickness as quickly as two points per second. A motorized R-Theta stage accepts standard and custom chucks for samples up to 450mm in diameter. (This is the same high-lifetime stage that performs millions of measurements in our production systems!) Map patterns can be polar, rectangular, or linear, or you can create your own with no limit on the number of measurement points. Dozens of pre-defined map patterns are supplied. The F50 film thickness mapping system connects to the USB port of your Windows® computer and can be set up in minutes. The different F50 instruments are distinguished primarily by thickness and wavelength range. The standard F50 is the most popular. Generally shorter wavelengths (e.g. F50-UV) are required for measurement of thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.
